]>
PCF29F64
8 K × 8-bit static CMOS EEPROM with PAGE-ERASE
option
January 1993
Philips
23433
VSS
Negative supply voltage
0
V
Tamb
Ambient temperature range
-40 to +85
°C
VCE
CE
Chip enable input (voltage)
VIL
V
VCE
CE
Chip enable input (voltage)
VIH
V
VOE
OE
Output enable input (voltage)
VIL
V
VWE
WE
Write enable input (voltage)
VIH
V
f
frequency
5
M
Hz
all other pins
VIL or VIH
V
IOH
High-level output current
-400
µ
A
IOL
Low-level output current
2.1
m
A
VO
Output voltage
VDD or VSS
V
VI
Input voltage
VDD or VSS
V
VI/O
Input/output voltage
VSS
V
|ZI|
Input impedance
> 500
Ω
VDD
Supply voltage
5±10%
V
VDD
Supply voltage
4.5 to 5.5
V
Input pulse levels
0 to 3
V
Input rise and fall times
10
n
s
Input and output timing levels
1.5
V
Output load
outputs open
Output load
1 TTL gate and CL = 100 pF
other inputs
VIL or VIH
V
Input level
CMOS input level
Input level
TTL input level
VI
Input voltage
VSS
V
VDD
Supply voltage range
4.5
V
5.5
V
IDDR
supply current READ
5.0
m
A
IDDW
supply current ERASE/WRITE
10.0
m
A
IDDO
supply current STANDBY
200
µ
A
IDDO
supply current STANDBY
2
m
A
VIL
LOW level input voltage (CMOS input level)
VSS-0.3
V
VSS+0.3
V
VIL
LOW level input voltage (TTL input level)
-1.0
V
0.8
V
VIH
HIGH level input voltage (CMOS input level)
VDD-0.3
V
VDD+0.3
V
VIH
HIGH level input voltage (TTL input level)
2.0
V
VDD+1.0
V
VOL
LOW level output voltage
0.4
V
VOH
HIGH level output voltage
2.4
V
ILI
Input leakage current
1
µ
A
ILO
Output leakage current
1
µ
A
CI
Input capacitance
tbf
p
F
CI/O
input/output capacitance
tbf
p
F
tPU
power-up to operation time
5
m
s
VDD
supply voltage
-0.3
V
+7.0
V
VI
voltage on any input pin
VSS-0.8
V
VDD+0.8
V
II
current on any input pin
1
m
A
IO
output current
5
m
A
Tstg
storage temperature
-65
°C
+150
°C
Tamb
operating ambient temperature
-40
°C
+85
°C
tRC
read cycle time
200
n
s
tAA
address access time
200
n
s
tCE
chip enable access time
200
n
s
tOE
output enable access time
100
n
s
tLZ
chip enable to output LOW Z
0
n
s
tOHZ
output disable to output HIGH Z
0
n
s
50
n
s
tOLZ
output enable to output LOW Z
0
n
s
tHZ
chip disable to output HIGH Z
0
n
s
50
n
s
tOH
output hold time from address change
10
n
s
tAS
address set-up time
10
n
s
tAH
address hold time
200
n
s
tEC
erase cycle time
4
m
s
6
m
s
tWC
write cycle time
2
m
s
2.5
m
s
3
m
s
tCS
operation set-up time
0
n
s
tCH
operation hold time
0
n
s
tCW
chip enable pulse width
150
n
s
tOES
output enable HIGH set-up time
10
n
s
tOEH
output enable HIGH hold time
10
n
s
tWP
write enable pulse width
150
n
s
tWPH
write enable HIGH recovery time
50
n
s
tDV
data valid time
300
n
s
tDS
data set-up time
100
n
s
tDH
data hold time
20
n
s
A0
A0
address inputs which select an 8-bit memory location during a read or write operation
A1
A1
A2
A2
A3
A3
A4
A4
A5
A5
A6
A6
A7
A7
A8
A8
A9
A9
A10
A10
A11
A11
A12
A12
I/O 0
I/O 0
data is written to or read from the PCF29F64 via the I/O pins
I/O 1
I/O 1
I/O 2
I/O 2
I/O 3
I/O 3
I/O 4
I/O 4
I/O 5
I/O 5
I/O 6
I/O 6
I/O 7
I/O 7
negative supply voltage
VSS
negative supply voltage
Chip Enable
CE
Chip Enable input which must be LOW to enable all read/write operations, when HIGH power consumption is reduced
Output enable
OE
Output Enable input which controls the data output buffers and is used to initiate read operations
not connected
n.c.
not connected
Write enable
WE
Write Enable input which controls the writing of data to the PCF29F64
positive supply voltage
VDD
positive supply voltage
Mode
MODE
selection of Erase mode is achieved by a HIGH at this input, LOW selects the Write mode
Address bus
address inputs which select an 8-bit memory location during a read or write operation
10
9
8
7
6
5
4
3
25
24
21
23
2
I/O Bus
data is written to or read from the PCF29F64 via the I/O pins
11
12
13
15
16
17
18
19
Power
14
28
Control
1
20
22
27
Not connected
26
DC CHARACTERISTICS
TIMING CHARACTERISTICS
Read cycle
Erase and Write cycle
Limiting values
DC CHARACTERISTICS
Timing characteristics
AC test conditions
PCF29F64
8 K × 8-bit static CMOS EEPROM with PAGE-ERASE options
1.2 micron (n-channel floating gate) CMOS
PCF29F64
P
PCF29F64
T
FEATURES
Low Power CMOS
maximum active current
maximum standby current
Access time
Fast Erase cycle time
32-byte Erase operation (PAGE-Erase)
5 ms
256-byte Erase operation
(BLOCK-Erase) 5 ms
complete Memory Erase operation 5 ms
Fast Write cycle time
Data Polling
allows user to minimize Write cycle time
Simple Write operation
single TTL-level
WE signal
internally latched address and
data
automatic Write
timing
Endurance 10 000; Tamb=85
°C
10 years non-volatile data retention
time.
GENERAL DESCRIPTION
The PCF29F64 is an 8 K × 8-bit floating gate electrically erasable programmable read only memory (EEPROM),
fabricated in a 1.2 micron n-chanel floating date CMOS
technology.
Power consumption is very low and reliability is high due to the full CMOS technology used, as that for the PCX8582 family.
Three different Erase-operation modes are offered by the PCF29F64:
32-byte Erase operation (PAGE)
256-byte Erase operation (BLOCK)
Complete Memory Erase operation
A write operation is performed in approximately , which allows the entire memory to be written in less than 21 s.
The PCF29F64 features the JEDEC approved pinout for byte-wide memories, compatible with industry standard RAMs, ROMs and EPROMs.
Philips EPROMs and PAGE-EEPROMs are designed and tested for applications requiring extended endurance. Data retention is specified to be greater that 10 years.
QUICK REFERENCE DATA
SYMBOL
PARAMETER
MIN.
TYP.
MAX.
UNIT
–
–
–
–
–
–
–
–
–
ORDERING INFORMATION
EXTENDED TYPE NUMBER
PACKAGE
PINS
PIN POSITION
MATERIAL
CODE
PCF29F64P
28
DIL
plastic
SOT117
PCF29F64T
28
SO28
plastic
SOT136
Block diagram.
Pin Configuration.
PINNING
SYMBOL
PIN
DESCRIPTION
to
to
,
,
, ,
, ,
to
to , to
LIMITING VALUES
In accordance with Absolute Maximum Rating System (IEC 134).
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
–
–
= ; = ; = ; unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
Supplies
–
= = ;
= ;
; = ;
=
–
–
see Figs 4 to 7
–
–
= ; = ;
=
–
–
–
–
LOW level input voltage
CMOS
–
TTL
–
HIGH level input voltage
CMOS
–
TTL
–
=
–
–
=
–
–
=
–
–
= ;
=
–
–
=
–
–
=
–
–
–
–
= ; = ; unless otherwise specified.
SYMBOL
PARAMETER
MIN.
MAX.
UNIT
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
Mode selection
CE
OE
WE
MODE
I/O PIN
POWER
L
L
H
read
D OUT
active
L
H
L
erase (MODE input =
HIGH)
-
active
L
H
L
write (MODE input = LOW)
D IN
active
H
X
X
standby and E/W
inhibit
HIGH Z
standby
X
L
X
E/W inhibit
-
X
X
H
E/W inhibit
-
Erase Mode selection
MODE/ADDRESS
A0 to A2
A3
A4
A5 to A7
A8 to A12
PAGE
X
0
0
valid
valid
BLOCK ERASE
X
0
1
X
valid
(note 1)
Note to Table 2
If either A3 or A4 have a HIGH level, BLOCK ERASE mode is
selected.
BLOCK |ERASE
X
1
0
X
valid
(note 1)
FULL ERASE
X
1
1
X
X
DEVICE
OPERATIONS
Read
Read operations are initiated by both OE and CE set LOW. The read operation is terminated by either CE or OE returning HIGH. This 2-line control architecture eliminates bus contention in a system environment. The data bus will be in a high impedance state when either OE or CE is HIGH.
Erase
Erase operations are initiated when both CE and WE are LOW and OE and MODE are HIGH. The PCF29F64 supports a CE and WE controlled cycle. That is, the address is latched by the falling edge of either CE or WE, which ever occurs last.
An erase operation, once initiated, will automatically continue to completion, typically within 5 ms.
Write
Write operations are initiated when both CE and WE are LOW and OE is HIGH. The PCF29F64 supports both a CE and WE controlled write cycle. That is, the address is latched by the falling edge of either CE or WE, whichever occurs last. Similarly, the data is latched internally by the rising edge of either CE or WE, whichever occurs first. A byte write operation, once initiated, will automatically continue to completion, typically within 2.5 ms.
Data Polling
The PCF29F64 features Data polling as a method to indicate to the host system that the byte write cycle has completed. Data polling allows a simple bit test operation to determine the status of the PCF29F64 eliminating additional interrupt inputs or external hardware. During the internal programming cycle, any attempt to read the last byte written will produce the complement of that data on I/O 7 (i.e. write data = 0XXX XXXX; read data = 1XXX XXXX)
Once the programming cycle is complete, I/O 7 will reflect the true data.
ERASE-WRITE
PROTECTION
There are three features that protect the non-volatile data from inadvertent Erase and Write operations.
Noise protection; write pulse of less that 20 ns will not initiate a write cycle.
VDD sense; all functions are inhibited when VDD is ≥ 3.5 V typically.
E/W inhibit; holding either OE LOW, WE HIGH or CE HIGH during power-on and power-off, will
inhibit inadvertent Erase and Write operations.
Timing Diagram; Read Cycle.
Timing Diagram;CE controlled Erase cycle.
Timing Diagram;WE controlled Erase cycle.
Timing Diagram;CE controlled Write cycle.
Timing Diagram;WE controlled Write cycle.
Timing Diagram; Data polling.
APPLICATION
INFORMATION
The use of Flash EEPROM (FEEPROM facilitates opportunities to make embedded applications where new releases of firmware or modified parameter sets can be programmed by means of in-circuit programming.
Advantages of in-circuit programming over existing programming schemes are:
No loss of time due to UV erasing
No desoldering required. This is critical in applications with high component densities.
No expensive and large sockets required. This becomes important when e.g. QFP packages are used.
The in-circuit programming of FEEPROM in an application can be initiated via e.g. a terminal or PC. In-circuit programming may also be controlled from a remote location via e.g. an RS232, RS485 or a telephone link. This makes the modification of firmware in applications that are installed in remote locations (e.g. somewhere in an industrial factory) possible.
The block diagram
(Fig.9) gives an example of how to use the FEEPROM with an 80C51 family microcontroller for remote downloading of firmware and parameter sets via a telephone line. The system consists of an 80C51/87C51 microcontroller, a PCF29F64 8 k × 8 FEEPROM, an RS232 driver, a MODEM and some glue logic.
The 80C51/87C51 contains firmware that has the following main tasks:
MODEM control and handshaking (e.g. RTS/CTS or XON/XOFF)
Protocol handling of downloaded file
Programming control of FEEPROM
The addresses of the FEEPROM are mapped in such a way, that they are greater than the highest memory address of the microcontroller. For an 80C51/87C51 this will be 4 K. To achieve this an external address decoder is used. The erase mode of the FEEPROM is controlled by the level on the MODE pin. This pin is connected to an address decoder output in such a way, that for erasing a shadow 8 K memory area exists. Erasing can be performed by a correct write action to this memory area.
The CE signal for the FEEPROM is gated with the RESET of the microcontroller. The reason for this is to prevent unwanted write actions to the FEEPROM during power-up. This may occur when the power is already within the specified values, but the oscillator of the microcontroller has not yet started up. In this time frame the status of the microcontroller port pins is undefined.
By combining the microcontroller RD and PSEN signals, the PCF29F64 is accessible as both program memory and external data memory.
After power-on the program will start from the internal microcontroller program. This program will carry out some modem initialization and then jump to the user program in the PCF29F64. The interrupt vector addresses in the microcontroller must be remapped to the PCF29F64, so that execution of the user interrupt service routine is possible. When data is about to be received (via the RS232 DCD line or is received (UART interrupt), the download program in the microcontroller is started. The received data file should be an absolute output file such as e.g. an INTEL Intellec-8 HEX file. During the download/programming time, interrupts that are mapped to the PCF29F64 address space, should be disabled to prevent unintentional jumps to the FEEPROM. When the communication is finished and all data programmed in the FEEPROM, the firmware in the microcontroller may jump again to the user program in the PCF29F64.
As previously mentioned, the PCF29F64 may be used as user program and external data memory. However, when the user program wants to program or erase FEEPROM location(s) in the same PCF29F64 device, program execution from this device is inhibited. A solution may be that the FEEPROM programming routines for the user program reside in the microcontroller program memory. Program execution should stay there in a loop, until programming or erasing of the PCF29F64 is finished. Remapped interrupts to a PCF29f64 device that will be programmed, should be disabled to prevent unintentional jumps to this device. When program execution is carried out from the internal microcontroller memory, the AD0 to AD7 pins will float. To assure defined levels on the I/O0 to I/O7 pins of the FEEPROM, pull-up resistors.
Application diagram
PACKAGE OUTLINES
28-lead dual in-line; plastic (SOT117).
28-lead mini-pack; plastic (SO28; SOT136).
SOLDERING
Plastic dual in-line packages
By dip or wave
The maximum permissible temperature of the solder is 260 °C;
this temperature must not be in contact with the joint for more than 5 s.
The total contact time of successive solder waves must not exceed 5 s.
The device may be mounted up to the seating plane, but the temperature of the plastic body must not exceed the specified storage maximum. If the printed-circuit board has been pre-heated, forced cooling may be necessary immediately after soldering to keep the temperature within
the permissible limit.
Repairing soldered joints
Apply the soldering iron below the seating plane (or not more
than 2 mm above it). If its temperature is below 300 °C, it must not be
in contact for more than 10 s; if between 300 and 400 °C, for not more
than 5 s.
SOLDERING
Plastic mini-packs
By wave
During placement and before soldering, the component must be fixed with a droplet of adhesive. After cutting the adhesive, the component can be soldered. The adhesive can be applied by screen printing, pin transfer or syringe dispensing.
Maximum permissible solder temperature is 260 °C, and maximum duration of package immersion in solder bath is 10 s, if allowed to cool to less than 150 °C within 6 s. Typical dwell time is 4 s at 250 °C.
A modified wave soldering technique is recommended using two solder waves (dual-wave), in which a turbulent wave with high upward pressure is followed by a smooth laminar wave. Using a mildly-activated flux eliminates the need for removal of corrosive residues in most applications.
By solder paste reflow
Reflow soldering requires the solder paste (a suspension of fine solder particles, flux and binding agent) to be applied to the substrate by screen printing, stenciling or pressure-syringe dispensing before device placement.
Several techniques exist for reflowing; for example, thermal conduction by heated belt, infrared, and vapour-phase reflow. Dwell times vary between 50 and 300 s according to method. Typical reflow temperatures range from 215 to 250 °C.
Preheating is necessary to dry the paste and evaporate the
binding agent. Preheating duration: 45 min at 45 °C.
Repairing soldered joints (by
hand-held soldering iron or pulse-heated solder tool)
Fix the components by first soldering two, diagonally opposite,
end pins. Apply the heating tool to the flat part of the pin only. Contact time must be limited to 10 s at up to 300 °C. When using proper tools, all other pins can be soldered in one operation within 2 to 5 s at between 270 and 320 °C. (Pulse-heated soldering is not recommended for SO packages.
For pulse-heated solder tool (resistance) soldering of VSO
packages, solder is applied to the substrate by dipping or by an extra thick
tin/lead plating before package placement.
DEFINITIONS
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification
This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may effect device reliability.
Application Information
Where application information is given, it is advisory and does
not form part of the specification.
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℗Philips Electronics N.V. 1993
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